引用本文:谭秀美,肖先勇,张逸,等.基于敏感过程运行状态的事件型电能质量扰动损失评估[J].电力系统保护与控制,2018,46(6):84-89.
TAN Xiumei,XIAO Xianyong,ZHANG Yi,et al.Assessment of economic loss caused by event power quality disturbances based on sensitive process running states[J].Power System Protection and Control,2018,46(6):84-89
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基于敏感过程运行状态的事件型电能质量扰动损失评估
谭秀美1,肖先勇1,张 逸2,马愿谦1
(1.四川大学电气信息学院,四川 成都 610065;2.国网福建电科院,福建 福州 350003)
摘要:
电压暂降和短时电压中断等事件型电能质量扰动导致的敏感生产过程经济损失评估,是电能质量解决方案投资决策的关键。从事件型电能质量扰动水平、设备运行状态和过程参数免疫时间(Parameter Immunity Time, PIT)出发,研究发生电压暂降时生产过程的运行状态特性,并将PIT作为用户遭受的事件型电能质量扰动与所导致损失的桥梁。详细研究了遭受电压暂降时生产过程运行状态的诊断和识别方法,利用质量损失函数计算生产过程非正常非中断状态的中断隶属度,提出一种改进的敏感过程事件型电能质量经济损失评估方法。最后,以所在团队实际调查的某半导体制造企业为例,证明了提出方法的正确性和可行性。
关键词:  事件型电能质量扰动  敏感设备  经济损失  过程参数免疫时间  非正常非中断状态
DOI:10.7667/PSPC170345
分类号:
基金项目:国家电网公司科技项目(SGRI-DL-71-15-006)
Assessment of economic loss caused by event power quality disturbances based on sensitive process running states
TAN Xiumei1,XIAO Xianyong1,ZHANG Yi2,MA Yuanqian1
(1. College of Electrical Engineering and Information Technology, Sichuan University, Chengdu 610065, China;2. State Grid Fujian Electrical Power Research Institute, Fuzhou 350003, China)
Abstract:
The evaluation of the sensitive process economic loss caused by event power quality disturbances such as voltage sag and short supply interruption is the key to make the power quality solution investment decisions. This paper, embarking from the event power quality disturbance level, the running states of the equipment and the parameter immunity time (PIT), studies the characteristics of the process running states when happened voltage sag and makes PIT as the bridge of the event power quality disturbances suffered by the user and the resulting economic losses. The process running state diagnosis and identification method are studied in detail when voltage sags occur. The quality loss function is used to calculate the interruption membership of the non normal non interrupted process state to quantify losses, an improved sensitive process economic loss assessment method is proposed. Finally, a semiconductor manufacturing enterprise which the author's team has investigated in the past is taken as an example to prove the correctness and feasibility of the proposed method. This work is supported by the Science and Technology Project of State Grid Corporation of China (No. SGRI-DL- 71-15-006).
Key words:  event power quality disturbances  sensitive equipment  economic loss  process parameter immunity time  non normal non interrupted state
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