引用本文:杨广羽,马玉新,傅亚光,等.光电耦合MOS栅固态继电器回路研究与误触发改进措施[J].电力系统保护与控制,2016,44(15):135-141.
YANG Guangyu,MA Yuxin,FU Yaguang,et al.Research of photoelectric MOS gate solid state relay circuit and spurious triggering improvement[J].Power System Protection and Control,2016,44(15):135-141
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光电耦合MOS栅固态继电器回路研究与误触发改进措施
杨广羽1,马玉新2,傅亚光1,刘 敏1,王彦宾1
(1.许继电气股份有限公司, 河南 许昌 461000;2.国网伊犁供电公司,新疆 伊宁 835000)
摘要:
为了解决带开关光电耦合MOS栅驱动回路出现上级回路无动作,下级MOSFET栅微型固态继电器误触发的不足,对MOS栅微型固态继电器的原理进行分析与研究。基于驱动回路固有特点,综述了其工作原理及MOSFET场效应管静态开关特性,理论推导出开关开合时,回路中电容充放电动态过程。针对这种驱动回路,提出增加电阻回路等安全性能更高的改进措施。通过实验,验证其可靠性。实验结果证明了理论推导暂态过程的正确性及措施的可行性,为光电耦合MOSFET栅微型固态继电器提供了新的回路方案,有效地减少接口信号回路引起的直流工程故障停运。
关键词:  光电耦合  微型固态继电器  MOSFET场效应  动态过程  电容
DOI:10.7667/PSPC160113
分类号:
基金项目:
Research of photoelectric MOS gate solid state relay circuit and spurious triggering improvement
YANG Guangyu1,MA Yuxin2,FU Yaguang1,LIU Min1,WANG Yanbin1
(1. XJ Electric Co., Ltd., Xuchang 461000, China; ;2. State Grid Yili Electric Power Supply Company, Yining 835000, China)
Abstract:
In order to solve the MOS photoelectric coupling circuit of mini solid state relay with switch triggered by mistake when the upper loop no action, the principle of mini solid state relay is analyzed and researched. Meanwhile, it summarizes the working principle and static features of MOSFET field-effect tube. Based on the characteristics of the circuit, the loop capacitor charge and discharge dynamic process is deduced when switch opening and closing. The reasons for false triggering are identified, and then this driving circuit with higher safety performance improvement measures is put forward. The test results show the reliability of the measures. The experimental results prove the validity of the theoretical derivation transient process and measures of feasibility. These improvement measures provide a new circuit scheme for photoelectric MOS gate mini solid state relay. It also can effectively decrease DC project outage caused by interface circuit fault.
Key words:  photoelectric coupling  mini solid state relay  MOSFET field-effect tube  dynamic procedure  capacitance
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