| 引用本文: | 石光,赵勇,杨经超,等.一种光IRIG-B/FT3码自适应技术及其
在智能变电站测试仪器中的应用[J].电力系统保护与控制,2014,42(18):110-115. |
| SHI Guang,ZHAO Yong,YANG Jing-chao,et al.Adaptive technique for optic IRIG-B/FT3 codes and its application in handheld test device for smart substation[J].Power System Protection and Control,2014,42(18):110-115 |
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| 一种光IRIG-B/FT3码自适应技术及其
在智能变电站测试仪器中的应用 |
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石光1, 赵勇2, 杨经超3,4, 孔圣立1, 张道农5, 韩伟1, 张克声3
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1.国网河南省电力公司电力科学研究院,河南 郑州 450052;2.中广核太阳能开发有限公司,北京 100048;3.华中科技大学,湖北 武汉 430074;4.武汉凯默电气有限公司,湖北 武汉 430223;5.华北电力设计院工程有限公司,北京 100120
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| 摘要: |
| 为适应电力设备测试仪器的低成本、智能化、便携化需求,提出了一种光IRIG-B/FT3码自适应技术。该技术利用高频时钟对光串口IRIG-B/FT3码流进行处理,并根据两种输入码在编码特征和码流速率上的差异,自动识别光IRIG-B码报文和IEC60044-8(FT3)采样值报文,扩展了智能变电站测试仪器的功能。基于该技术研制的手持式智能变电站测试仪器,已成功应用于多个国内变电站的系统联调和现场测试。实测结果表明该技术的有效性和实用性,从而达到了减少测试仪器接口的数量、降低测试仪器功耗和成本的目的。 |
| 关键词: 智能变电站 光IRIG-B码 光FT3报文 自适应技术 测试仪器 |
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| Adaptive technique for optic IRIG-B/FT3 codes and its application in handheld test device for smart substation |
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SHI Guang1, ZHAO Yong2, YANG Jing-chao3,4, KONG Sheng-li1, ZHANG Dao-nong5, HAN Wei1, ZHANG Ke-sheng3
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1.State Grid Henan Electric Power Research Institute, Zhengzhou 450052, China;2.CGN Solar Energy Development Co., Ltd, Beijing 100048, China;3.Huazhong University of Science and Technology, Wuhan 430074, China;4.Wuhan Kemov Electric
Co., Ltd, Wuhan 430223, China;5.North China Power Engineering Co., Ltd, Beijing 100120, China
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| Abstract: |
| To accommodate a low cost, portable and intelligent requirement for test devices of electrical equipments, this paper proposes an adaptive technique for optic IRIG-B codes and FT3 sample value codes. Based on the different structure properties and bit rate between IRIG-B codes and FT3 codes, the technique can automatically recognize those two kinds of codes by processing the input stream through a serial port with high frequency clock signal. This technique extends the functions of test device for smart substation. The handheld test device using this technique has been successfully applied in the system test and field test for several smart substations. The test results demonstrate the validity and practicability of the proposed technique, which reduces the number of ports of test device with decreasing its power consumption and cost. |
| Key words: smart substation optic IRIG-B codes optic FT3 codes adaptive technique test device |